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"Analysis of hot carrier-induced degradation of Horizontal Current Bipolar ..."

Josip Zilak, Marko Koricic, Tomislav Suligoj (2017)

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DOI: 10.23919/MIPRO.2017.7973394

access: closed

type: Conference or Workshop Paper

metadata version: 2017-07-19

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Josip Zilak, Marko Koricic, Tomislav Suligoj:
Analysis of hot carrier-induced degradation of Horizontal Current Bipolar Transistor (HCBT). MIPRO 2017: 77-82

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