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"Use it or lose it: wear-out and lifetime in future chip multiprocessors."

Hyungjun Kim et al. (2013)

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DOI: 10.1145/2540708.2540721

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-11

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  dblp key:
  - conf/micro/KimVGS13
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  persistent URL:
  - https://dblp.org/rec/conf/micro/KimVGS13
Hyungjun Kim, Arseniy Vitkovskiy, Paul V. Gratz, Vassos Soteriou:
Use it or lose it: wear-out and lifetime in future chip multiprocessors. MICRO 2013: 136-147

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