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"In-Situ Observation of Fracture Behavior of Silicon in a Transmission ..."

Kohei Okada et al. (2018)

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DOI: 10.1109/MHS.2018.8886952

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-07

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  dblp key:
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Kohei Okada, Syugo Tanaka, Kensuke Nakata, Masahiro Nakajima, Taeko Ando:
In-Situ Observation of Fracture Behavior of Silicon in a Transmission Electron Microscope. MHS 2018: 1-3

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