"Development of novel tensile testing device for SEM observation of thin ..."

Kensuke Nakata, Taeko Ando (2019)

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DOI: 10.1109/MHS48134.2019.9249346

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-19

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Kensuke Nakata, Taeko Ando:
Development of novel tensile testing device for SEM observation of thin films under tension. MHS 2019: 1-3

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