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"High-level test data generation for software-based self-test in ..."

Adeboye Stephen Oyeniran et al. (2017)

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DOI: 10.1109/MECO.2017.7977167

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

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  - https://dblp.org/rec/conf/meco/OyeniranJTU17
Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar:
High-level test data generation for software-based self-test in microprocessors. MECO 2017: 1-6

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