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"Image-Based Defect Detection in Assembly Line with Machine Learning."

Giovanni Burresi et al. (2021)

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DOI: 10.1109/MECO52532.2021.9460291

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-06

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  dblp key:
  - conf/meco/BurresiLGCTR21
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  - https://dblp.org/rec/conf/meco/BurresiLGCTR21
Giovanni Burresi, Martino Lorusso, Lisa Graziani, Alice Comacchio, Federico Trotta, Antonio Rizzo:
Image-Based Defect Detection in Assembly Line with Machine Learning. MECO 2021: 1-5

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