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"Characterizing Temperature, Power, and Soft-Error Behaviors in Data Center ..."

Bin Nie et al. (2017)

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DOI: 10.1109/MASCOTS.2017.12

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/mascots/NieXGEST17
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  persistent URL:
  - https://dblp.org/rec/conf/mascots/NieXGEST17
Bin Nie, Ji Xue, Saurabh Gupta, Christian Engelmann, Evgenia Smirni, Devesh Tiwari:
Characterizing Temperature, Power, and Soft-Error Behaviors in Data Center Systems: Insights, Challenges, and Opportunities. MASCOTS 2017: 22-31

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