"Towards a Scalable Test Solution for the Analysis of Interconnect Shorts ..."

Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas (2016)

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DOI: 10.1109/MASCOTS.2016.52

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks. MASCOTS 2016: 394-399

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