"Chip Surface Defect Recognition based on Improved Faster R-CNN."

Chengxia Ma et al. (2022)

Details and statistics

DOI: 10.1109/M2VIP55626.2022.10041049

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-27

a service of  Schloss Dagstuhl - Leibniz Center for Informatics