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"Automatic Character Detection System for IC Test Handler Based on Active ..."

Tianshan Wang et al. (2017)

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DOI: 10.1007/978-981-10-6373-2_34

access: closed

type: Conference or Workshop Paper

metadata version: 2017-09-21

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  dblp key:
  - conf/lsms/WangJ0ZG17
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Tianshan Wang, Fan Jiang, Xiaojin Zhu, Hesheng Zhang, Zhiyuan Gao:
Automatic Character Detection System for IC Test Handler Based on Active Learning SVM. LSMS/ICSEE (2) 2017: 333-342

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