"On-Line BIST for Testing Analog Circuits."

Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis (2000)

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type: Conference or Workshop Paper

metadata version: 2023-07-25

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Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis:
On-Line BIST for Testing Analog Circuits. LATW 2000: 193-195

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