"Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault ..."

Marcial Jesús Rodríguez-Irago et al. (2006)

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type: Conference or Workshop Paper

metadata version: 2023-07-27

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Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic Fault Detection in Digital Systems. LATW 2006: 103-107

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