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"Testing Heatsink Faults in Power Transistors by means of Thermal Model."

Davide Piumatti et al. (2020)

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DOI: 10.1109/LATS49555.2020.9093674

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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  dblp key:
  - conf/latw/PiumattiQRF20
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  - https://dblp.org/rec/conf/latw/PiumattiQRF20
Davide Piumatti, Matteo Vincenzo Quitadamo, Matteo Sonza Reorda, Franco Fiori:
Testing Heatsink Faults in Power Transistors by means of Thermal Model. LATS 2020: 1-6

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