"Analysis and detection of hard-to-detect full open defects in FinFET based ..."

Zahira Perez et al. (2020)

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DOI: 10.1109/LATS49555.2020.9093680

access: closed

type: Conference or Workshop Paper

metadata version: 2021-09-03

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Zahira Perez, Javier Mesalles, Hector Villacorta, Fabian Vargas, Víctor H. Champac:
Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells. LATS 2020: 1-6

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