"A New Method to Extract the Silicon Film Thickness of Enhancement Mode ..."

A. S. Nicolett et al. (2000)

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type: Conference or Workshop Paper

metadata version: 2023-07-26

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A. S. Nicolett, João A. Martino, E. Simoen, C. Claeys, Marcelo Bellodi, M. A. Pavanello:
A New Method to Extract the Silicon Film Thickness of Enhancement Mode Fully Depleted SOIN MOSFETs. LATW 2000: 264-267

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