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"A novel Pattern Selection Algorithm to reduce the Test Cost of large ..."
Giusy Iaria et al. (2022)
- Giusy Iaria, Francesco Angione
, Paolo Bernardi, Matteo Sonza Reorda
, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS 2022: 1-6
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