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"Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with ..."

Thiago Copetti et al. (2020)

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DOI: 10.1109/LATS49555.2020.9093667

access: closed

type: Conference or Workshop Paper

metadata version: 2020-05-19

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  - conf/latw/CopettiMTHPB20
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Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen:
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. LATS 2020: 1-6

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