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"A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive ..."

Thiago Santos Copetti et al. (2019)

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DOI: 10.1109/LATW.2019.8704579

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-07

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  dblp key:
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Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls:
A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS 2019: 1-6

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