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"A Test Architecture and VIE to Characterize Dielectric Absorption in Small ..."

Carlos Bernal et al. (2020)

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DOI: 10.1109/LATS49555.2020.9093687

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-29

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  dblp key:
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  - https://dblp.org/rec/conf/latw/BernalJAC20
Carlos Bernal, Manuel Jiménez, Chris Aquino, Raul Cedres:
A Test Architecture and VIE to Characterize Dielectric Absorption in Small Capacitors. LATS 2020: 1-5

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