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"Reliability evaluation of circuits designed in multi- and single-stage ..."

Rafael B. Schvittz et al. (2018)

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DOI: 10.1109/LASCAS.2018.8399927

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  - conf/lascas/SchvittzPMFNRB18
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Rafael B. Schvittz, Matheus F. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, Leomar S. da Rosa, Paulo F. Butzen:
Reliability evaluation of circuits designed in multi- and single-stage versions. LASCAS 2018: 1-4

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