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"Process and temperature impact on single-event transients in 28nm FDSOI CMOS."

Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Reis (2017)

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DOI: 10.1109/LASCAS.2017.7948062

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-22

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  - conf/lascas/BartraVR17
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Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Reis:
Process and temperature impact on single-event transients in 28nm FDSOI CMOS. LASCAS 2017: 1-4

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