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"On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection ..."

Sheetal Barekar, Madan Mali (2021)

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DOI: 10.1109/LASCAS51355.2021.9459175

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-02

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Sheetal Barekar, Madan Mali:
On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection Technique for Cache Memory. LASCAS 2021: 1-4

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