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"A Bayesian Risk Classification System Based on Two-Stage Clustering For ..."

Jander R. S. Vieira et al. (2023)

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DOI: 10.1109/LA-CCI58595.2023.10409315

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-20

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  dblp key:
  - conf/lacci/VieiraSOBF23
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Jander R. S. Vieira, Maria G. L. Silva, Sergio C. Oliveira, Byron L. D. Bezerra, Eduardo Fontana:
A Bayesian Risk Classification System Based on Two-Stage Clustering For Flashover Occurrence In High Voltage Insulator String. LA-CCI 2023: 1-6

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