"Defect Cause Search Support System Using Ontology and Bayesian Network in ..."

Kouki Hamamoto et al. (2016)

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DOI: 10.1016/J.PROCS.2016.08.264

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Kouki Hamamoto, Akira Kitamura, Satoshi Taguchi, Shingo Watanabe, Hiroki Matsuno:
Defect Cause Search Support System Using Ontology and Bayesian Network in Liquid Crystal Display Manufacturing Process. KES 2016: 859-868

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