"Multi-class Blind Steganalysis Based on Image Run-Length Analysis."

Jing Dong, Wei Wang, Tieniu Tan (2009)

> Home

Details and statistics

DOI: 10.1007/978-3-642-03688-0_19

access: closed

type: Conference or Workshop Paper

metadata version: 2019-03-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iwdw/DongWT09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iwdw/DongWT09
Jing Dong, Wei Wang, Tieniu Tan:
Multi-class Blind Steganalysis Based on Image Run-Length Analysis. IWDW 2009: 199-210

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.