"On thresholds for robust goodness-of-fit tests."

Jayakrishnan Unnikrishnan, Sean P. Meyn, Venugopal V. Veeravalli (2010)

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DOI: 10.1109/CIG.2010.5592803

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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  - conf/itw/UnnikrishnanMV10
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Jayakrishnan Unnikrishnan, Sean P. Meyn, Venugopal V. Veeravalli:
On thresholds for robust goodness-of-fit tests. ITW 2010: 1-4

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