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"Prediction of Field Failure Rate using Data Mining in the Automotive ..."

Gyungsik Yun, Hee-Won Jung, Sungbum Park (2018)

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DOI: 10.1016/J.PROCS.2018.10.242

access: open

type: Conference or Workshop Paper

metadata version: 2021-02-10

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  dblp key:
  - conf/itqm/YunJP18
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  - https://dblp.org/rec/conf/itqm/YunJP18
Gyungsik Yun, Hee-Won Jung, Sungbum Park:
Prediction of Field Failure Rate using Data Mining in the Automotive Semiconductor. ITQM 2018: 512-520

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