"Fault-coverage Maximizing March Tests for Memory Testing."

Feng Yun et al. (2022)

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DOI: 10.1109/ITC50671.2022.00066

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-21

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Feng Yun, Yunkun Lin, Lou Yunfei, Lei Gao, Vaibhav Gera, Boxuan Li, Vennela Chowdary Nekkanti, Aditya Rajendra Pharande, Kunal Sheth, Meghana Thommondru, Guizhong Ye, Sandeep Gupta:
Fault-coverage Maximizing March Tests for Memory Testing. ITC 2022: 529-533

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