"A New Method for Measuring Aperture Jitter in ADC Output and Its ..."

Takahiro J. Yamaguchi et al. (2008)

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DOI: 10.1109/TEST.2008.4700639

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, Koichiro Uekusa:
A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing. ITC 2008: 1-9

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