"A new method for measuring alias-free aperture jitter in an ADC output."

Takahiro J. Yamaguchi et al. (2015)

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DOI: 10.1109/TEST.2015.7342384

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma:
A new method for measuring alias-free aperture jitter in an ADC output. ITC 2015: 1-6

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