"Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions."

Lizhou Wu et al. (2021)

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DOI: 10.1109/ITC50571.2021.00022

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. ITC 2021: 143-152

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