BibTeX record conf/itc/WuHLL20

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@inproceedings{DBLP:conf/itc/WuHLL20,
  author    = {Chen{-}Hung Wu and
               Cheng{-}Yun Hsieh and
               Jiun{-}Yun Li and
               James Chien{-}Mo Li},
  title     = {qATG: Automatic Test Generation for Quantum Circuits},
  booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
               USA, November 1-6, 2020},
  pages     = {1--10},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/ITC44778.2020.9325228},
  doi       = {10.1109/ITC44778.2020.9325228},
  timestamp = {Mon, 25 Jan 2021 09:58:51 +0100},
  biburl    = {https://dblp.org/rec/conf/itc/WuHLL20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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