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"Definition of a robust modular SOC test architecture; resurrection of the ..."

Tom Waayers, Richard Morren, Roberto Grandi (2005)

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DOI: 10.1109/TEST.2005.1584022

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/itc/WaayersMG05
Tom Waayers, Richard Morren, Roberto Grandi:
Definition of a robust modular SOC test architecture; resurrection of the single TAM daisy-chain. ITC 2005: 10

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