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"A concurrent BIST scheme for on-line/off-line testing based on a ..."

Ioannis Voyiatzis et al. (2005)

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DOI: 10.1109/TEST.2005.1584079

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/VoyiatzisGPH05
Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis, Constantin Halatsis:
A concurrent BIST scheme for on-line/off-line testing based on a pre-computed test set. ITC 2005: 8

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