"The Cost and Speed Barriers in LSI/VLSI Testing : Can They Be Overcome By ..."

Frank F. Tsui (1985)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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Frank F. Tsui:
The Cost and Speed Barriers in LSI/VLSI Testing : Can They Be Overcome By Testability Design ? ITC 1985: 892-906

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