"An almost full-scan BIST solution-higher fault coverage and shorter test ..."

Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng (1998)

Details and statistics

DOI: 10.1109/TEST.1998.743305

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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