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"Improvements in Automated IC Socket Pin Defect Detection."
Vijayakumar Thangamariappan et al. (2022)
- Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao:
Improvements in Automated IC Socket Pin Defect Detection. ITC 2022: 568-572
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