"Improvements in Automated IC Socket Pin Defect Detection."

Vijayakumar Thangamariappan et al. (2022)

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DOI: 10.1109/ITC50671.2022.00074

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-12

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Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao:
Improvements in Automated IC Socket Pin Defect Detection. ITC 2022: 568-572

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