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"Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis."

Nandu Tendolkar et al. (2006)

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DOI: 10.1109/TEST.2006.297623

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  - conf/itc/TendolkarBSPGKCBTTA06
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  - https://dblp.org/rec/conf/itc/TendolkarBSPGKCBTTA06
Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich:
Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. ITC 2006: 1-9

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