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"Automated measurement of defect tolerance in mixed-signal ICs."

Stephen Sunter, Alessandro Valerio, Riccardo Miglierina (2016)

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DOI: 10.1109/TEST.2016.7805869

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/itc/SunterVM16
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Stephen Sunter, Alessandro Valerio, Riccardo Miglierina:
Automated measurement of defect tolerance in mixed-signal ICs. ITC 2016: 1-8

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