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"Stuck Fault and Current Testing Comparison Using CMOS Chip Test."

Thomas M. Storey et al. (1991)

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DOI: 10.1109/TEST.1991.519523

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske:
Stuck Fault and Current Testing Comparison Using CMOS Chip Test. ITC 1991: 311-318

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