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"A New Test Generation Approach for Embedded Analogue Cores in SoC."
M. Stancic et al. (2002)
- M. Stancic, Liquan Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff:
A New Test Generation Approach for Embedded Analogue Cores in SoC. ITC 2002: 861-869
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