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"Multi-die Parallel Test Fabric for Scalability and Pattern Reusability."

Arani Sinha et al. (2022)

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DOI: 10.1109/ITC50671.2022.00033

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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  dblp key:
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  - https://dblp.org/rec/conf/itc/SinhaCER22
Arani Sinha, Yonsang Cho, Jon Easter, Meizel V. Leiva Rojas:
Multi-die Parallel Test Fabric for Scalability and Pattern Reusability. ITC 2022: 249-257

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