"An AC/DC Test Generation System for Gate Array LSIs."

T. Shimono et al. (1985)

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type: Conference or Workshop Paper

metadata version: 2012-02-23

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T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, Shigehiro Funatsu:
An AC/DC Test Generation System for Gate Array LSIs. ITC 1985: 329-333

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