"A New Approach to DC Parameter Measurement in the Day of VLSI."

Takeshi Shigematsu, Takashi Sakamoto, Yoshio Yamanaka (1983)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-05

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  - https://dblp.org/rec/conf/itc/ShigematsuSY83
Takeshi Shigematsu, Takashi Sakamoto, Yoshio Yamanaka:
A New Approach to DC Parameter Measurement in the Day of VLSI. ITC 1983: 362-365

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