BibTeX record conf/itc/SchromHMVKF19

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@inproceedings{DBLP:conf/itc/SchromHMVKF19,
  author    = {Gerhard Schrom and
               Michael J. Hill and
               Sarath Makala and
               Ravi Sankar Vunnam and
               Arun Krishnamoorthy and
               Ryan Ferguson},
  title     = {Efficiency Measurement Method for Fully Integrated Voltage Regulators
               used in 4\({}^{\mbox{th}}\) and 5\({}^{\mbox{th}}\) Generation Intel{\textregistered}
               Core{\texttrademark} Microprocessors},
  booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
               USA, November 9-15, 2019},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/ITC44170.2019.9000125},
  doi       = {10.1109/ITC44170.2019.9000125},
  timestamp = {Mon, 24 Feb 2020 17:28:46 +0100},
  biburl    = {https://dblp.org/rec/conf/itc/SchromHMVKF19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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