"DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements."

R. Scharf et al. (1992)

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DOI: 10.1109/TEST.1992.527908

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/ScharfKHWM92
R. Scharf, Claus Kuntzsch, Klaus Helmreich, Werner Wolz, Klaus D. Müller-Glaser:
DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements. ITC 1992: 840-847

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