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"Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging ..."

Rosa Rodríguez-Montañés et al. (1991)

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DOI: 10.1109/TEST.1991.519713

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-20

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Rosa Rodríguez-Montañés, Jaume A. Segura, Víctor H. Champac, Joan Figueras, J. A. Rubio:
Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS. ITC 1991: 510-519

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