"Non-Volatile Programmable Devices and In-Circuit Test."

Douglas W. Raymond et al. (1994)

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DOI: 10.1109/TEST.1994.528029

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Douglas W. Raymond, Dominic F. Haigh, Ray Bodick, Barbara Ryan, Dale McCombs:
Non-Volatile Programmable Devices and In-Circuit Test. ITC 1994: 817-823

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