"Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower ..."

Saidapet Ramesh et al. (2023)

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DOI: 10.1109/ITC51656.2023.00045

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-09

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Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynänen, Sergej Schwarz:
Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. ITC 2023: 286-292

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