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"A reusable BIST with software assisted repair technology for improved ..."
Bruce Querbach et al. (2014)
- Bruce Querbach, Rahul Khanna, David Blankenbeckler, Yulan Zhang, Ronald T. Anderson, David G. Ellis, Zale T. Schoenborn, Sabyasachi Deyati, Patrick Chiang:
A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time. ITC 2014: 1-10
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